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Description
For now, let's use the table from #809 (comment):
I've gathered a list of the
esp-hal
modules and how hard/easy I think it would be to test those (take it with a grain of salt as I may have misevaluated some). Also, some modules can't be tested, or it does not make sense:
- aes
- DMA - AES DMA HIL Tests #1426
- Non- DMA - Add HIL testing #1297 and Improve AES HIL tests #1423
- analog -
- assist_debug -
- clock -Clock monitor HIL test #1425
- delay - Add
Delay
HIL test #1415 - ecc - Add HIL test for ECC #1418
- gpio -
- hmac -
- i2c -Adding
I2C
HIL test #2023 - i2s - Add I2S HIL test #1635
- lcd_cam - Implement async for lcd_cam i8080 #1834
- ledc -
- mcpwm -
- otg_fs -
- parl_io -
- pcnt - Add PCNT HIL test #1746
- rmt -
- rom - Add CRC and MD5 HIL tests #1417
- rsa
- Blocking HIL RSA tests #1414
- Async Test and fix async RSA #2002
- rtc_cntl -
- sha - HIL SHA tests #1422
- spi
- Half duplex -
- Full duplex
- DMA
- Half duplex - Add SPI Half Duplex Read HIL test #1782
- Full duplex - Add SPI Full Duplex DMA test #1443
- systimer - Fix S2 systimers #1979
- timer -
- trace -
- TWAI HIL test #1912
- uart
- blocking
- async
- usb_serial_jtag - Do not reset
UsbSerialJtag
peripheral #1961
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