Mask-aware wafer defect classification using a DenseNet-based CNN with explicit geometry masking and Grad-CAM explainability.
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Updated
Jan 4, 2026 - Jupyter Notebook
Mask-aware wafer defect classification using a DenseNet-based CNN with explicit geometry masking and Grad-CAM explainability.
Enterprise-grade ML platform for semiconductor wafer defect classification using ResNet-50 U-Net architecture with active learning.
Semiconductor wafer defect classification using classical machine learning models (SVM, Logistic Regression, Random Forest) on wafer map images.
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