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[SYCL][test][e2e][L0] Fix L0 batch event test reliability #16843

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Merged
merged 1 commit into from
Jan 31, 2025
Merged

[SYCL][test][e2e][L0] Fix L0 batch event test reliability #16843

merged 1 commit into from
Jan 31, 2025

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nrspruit
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@nrspruit nrspruit commented Jan 30, 2025 •
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  • Updated the Level Zero batch event test to correctly check only for the necessary messages to be printed proving the functionality is behaving correctly.

fixes #16695

@nrspruit nrspruit requested a review from a team as a code owner January 30, 2025 16:43
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[SYCL][test][e2e][L0] Fix L0 batch event test reliability
2a94843 
- Updated the Level Zero batch event test to correctly check only for
  the necessary messages to be printed proving the functionality is
behaving correctly.

Signed-off-by: Neil R. Spruit <neil.r.spruit@intel.com>
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@intel/llvm-gatekeepers , please review and merge when available to get the fixed test for better reliability and close out the current test issue. Thank you for your time!

@sarnex sarnex merged commit 816529f into intel:sycl Jan 31, 2025
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@kbenzie kbenzie kbenzie approved these changes

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Successfully merging this pull request may close these issues.

Adapters/level_zero_batch_event_status.cpp fails in pre-commit on PVC
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