NRF51_DK - AnalogIn, PWM, Concurrent GPIO failures (CI test shield)

Description

• Type: Bug
• Priority: Minor

---

Bug

Target
NRF51_DK

Toolchain:
GCC_ARM

Toolchain version:
6

mbed-cli version:
1.2.0

mbed-os sha:
Current master https://github.com/ARMmbed/mbed-os/#0906be6397c984026df180b07a3bbd965af52346

Expected behavior
All tests should pass.

Actual behavior

+------------------+---------------+-----------------------------+------------------------------------------------------------------------+--------+--------+--------+--------------------+
| target           | platform_name | test suite                  | test case                                                              | passed | failed | result | elapsed_time (sec) |
+------------------+---------------+-----------------------------+------------------------------------------------------------------------+--------+--------+--------+--------------------+
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-api-analogin          | Analog Input on AIN_0                                                  | 0      | 2      | FAIL   | 0.27               |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-api-analogin          | Analog Input on AIN_1                                                  | 0      | 2      | FAIL   | 0.27               |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-api-analogin          | Analog Input on AIN_2                                                  | 0      | 2      | FAIL   | 0.28               |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-api-analogin          | Analog Input on AIN_3                                                  | 0      | 2      | FAIL   | 0.28               |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-api-analogin          | Analog Input on AIN_4                                                  | 0      | 2      | FAIL   | 0.27               |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-api-analogin          | Analog Input on AIN_5                                                  | 0      | 2      | FAIL   | 0.27               |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-api-pwm_fall          | PWM_0 Frequency 30ms                                                   | 0      | 0      | ERROR  | 0.0                |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-api-pwm_rise          | PWM_0 Frequency 30ms                                                   | 0      | 0      | ERROR  | 0.0                |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-api-pwm_rise_fall     | PWM_0 Frequency 10ms                                                   | 0      | 0      | ERROR  | 0.0                |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-concurrent-comms      | Concurrent testing of I2C and SPI in a single thread                   | 0      | 3      | FAIL   | 5.61               |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-concurrent-comms      | Concurrent testing of I2C and SPI in multiple threads                  | 0      | 0      | ERROR  | 0.0                |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-concurrent-gpio       | Concurrent testing of DIO(D2,D3), AnalogIn(A0), and InterruptIn(D4,D5) | 0      | 2      | FAIL   | 0.19               |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-concurrent-gpio       | Concurrent testing of DIO(D3,D2), AnalogIn(A1), and InterruptIn(D5,D4) | 0      | 2      | FAIL   | 0.2                |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-concurrent-gpio       | Concurrent testing of DIO(D4,D5), AnalogIn(A2), and InterruptIn(D6,D7) | 0      | 2      | FAIL   | 0.19               |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-concurrent-gpio       | Concurrent testing of DIO(D5,D4), AnalogIn(A3), and InterruptIn(D7,D6) | 0      | 12     | FAIL   | 0.79               |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-concurrent-gpio       | Concurrent testing of DIO(D6,D7), AnalogIn(A4), and InterruptIn(D8,D9) | 0      | 12     | FAIL   | 0.78               |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-concurrent-gpio       | Concurrent testing of DIO(D7,D6), AnalogIn(A5), and InterruptIn(D9,D8) | 0      | 12     | FAIL   | 0.78               |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-concurrent-gpio       | Concurrent testing of DIO(D8,D9), AnalogIn(A5), and InterruptIn(D2,D3) | 0      | 2      | FAIL   | 0.2                |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-concurrent-gpio       | Concurrent testing of DIO(D9,D8), AnalogIn(A5), and InterruptIn(D3,D2) | 0      | 12     | FAIL   | 0.79               |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-concurrent-mixed      | Concurrent testing of Comms and GPIO in a single thread                | 0      | 3      | FAIL   | 19.25              |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-concurrent-mixed      | Concurrent testing of Comms and GPIO in multiple threads               | 0      | 0      | ERROR  | 0.0                |
+------------------+---------------+-----------------------------+------------------------------------------------------------------------+--------+--------+--------+--------------------+
mbedgt: completed in 1020.51 sec
mbedgt: exited with code 8

Steps to reproduce

Run the application at https://github.com/ARMmbed/ci-test-shield

i.e.

$ git clone https://github.com/ARMmbed/ci-test-shield.git && cd ci-test-shield

Set mbed-os version in mbed-os.lib

$ mbed deploy
$ mbed target auto
$ mbed toolchain GCC_ARM
$ mbed test -n tests-* --app-config .\mbed_app.json

[pan-]

The NRF51 DK is not Arduino compatible out of the box, it requires some hardware rework as indicated in the user guide.
Unfortunately, there's no way to completely disable Buttons (mapped from D5 to D9). That might explains some of the issues you are experiencing.
[Mirrored to Jira]

[0xc0170]

Unfortunately, there's no way to completely disable Buttons (mapped from D5 to D9). That might explains some of the issues you are experiencing.

@nvlsianpu @anangl Can you confirm that the issues above are known and expected?
[Mirrored to Jira]

[nvlsianpu]

Analog part was failing because input voltage range is set to 0-1.2 V, which causes input saturation. I will extend this to 3.6 V using build in analog prescaler.
[Mirrored to Jira]

[pan-]

@nvlsianpu Could you comment about the buttons ?
[Mirrored to Jira]

[nvlsianpu]

I'm investigating this.

[Mirrored to Jira]

[nvlsianpu]

This is all software related bugs - two patches for fix them are pending.
[Mirrored to Jira]

Thanks, I ran this again with the latest mbed-os and got the following results

+------------------+---------------+-----------------------------+------------------------------------------------------------------------+--------+--------+--------+--------------------+
| target           | platform_name | test suite                  | test case                                                              | passed | failed | result | elapsed_time (sec) |
+------------------+---------------+-----------------------------+------------------------------------------------------------------------+--------+--------+--------+--------------------+
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-api-pwm_fall          | PWM_0 Frequency 30ms                                                   | 0      | 0      | ERROR  | 0.0                |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-api-pwm_rise          | PWM_0 Frequency 30ms                                                   | 0      | 0      | ERROR  | 0.0                |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-api-pwm_rise_fall     | PWM_0 Frequency 10ms                                                   | 0      | 0      | ERROR  | 0.0                |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-concurrent-comms      | Concurrent testing of I2C and SPI in a single thread                   | 0      | 3      | FAIL   | 5.61               |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-concurrent-comms      | Concurrent testing of I2C and SPI in multiple threads                  | 0      | 0      | ERROR  | 0.0                |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-concurrent-mixed      | Concurrent testing of Comms and GPIO in a single thread                | 0      | 3      | FAIL   | 19.28              |
| NRF51_DK-GCC_ARM | NRF51_DK      | tests-concurrent-mixed      | Concurrent testing of Comms and GPIO in multiple threads               | 0      | 0      | ERROR  | 0.0                |
+------------------+---------------+-----------------------------+------------------------------------------------------------------------+--------+--------+--------+--------------------+

[Mirrored to Jira]

[pan-]

@ARMmbed/team-nordic Could you look at the remaining issues ?
[Mirrored to Jira]

[frkv]

The Nordic SDK team is very busy with an imminent SDK release. A lot of extra activities have been put on hold, as we are going out with a whole new architecture of our chips. We will look at this as soon as we can, but it may take some time.
[Mirrored to Jira]

[nvlsianpu]

@scartmell-arm And what were results for NRF52_DK? Didn't they pass?
For sure I'm in progress of the bug searching.
[Mirrored to Jira]

[nvlsianpu]

looks like after my last update to SPI wchih was on rev c295187. For this spi tests had passed .After this some changes corrupteds spi - still not sure which one.
[Mirrored to Jira]