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materials-characterization

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A Computer Vision-Based Tool for Automatic Segmentation and Size Analysis of Nanoparticles in Scanning Electron Microscope (SEM) and Transmission Electron Microscope (TEM) Images

  • Updated Jan 25, 2026
  • Python

This repository provides a comprehensive SOP for using the Keyence VK-X 3000 3D surface profiler for surface imaging and analysis. It covers step-by-step instructions for capturing optical images, performing 3D scans, and processing the results using the VK-X3000 MultiFileAnalyzer software.

  • Updated Sep 17, 2024

Open hardware reference design and supplementary specifications for the Advanced Transport Measurement System (ATMS). A modular cryogenic platform optimized for high-impedance transport, pyroelectric, and magnetodielectric characterization in PPMS (14T) and LN2 environments.

  • Updated Jan 30, 2026

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