diff --git a/src/platform/tests/BUILD.gn b/src/platform/tests/BUILD.gn
index 64c1925b22daff..d624e2858447d6 100644
--- a/src/platform/tests/BUILD.gn
+++ b/src/platform/tests/BUILD.gn
@@ -87,7 +87,10 @@ if (chip_device_platform != "none" && chip_device_platform != "fake") {
     }
 
     if (chip_device_platform == "linux") {
-      test_sources += [ "TestConnectivityMgr.cpp" ]
+      test_sources += [
+        "TestConnectivityMgr.cpp",
+        "TestFailSafeContext.cpp",
+      ]
     }
   }
 } else {
diff --git a/src/platform/tests/TestFailSafeContext.cpp b/src/platform/tests/TestFailSafeContext.cpp
new file mode 100644
index 00000000000000..2005540df6a9f5
--- /dev/null
+++ b/src/platform/tests/TestFailSafeContext.cpp
@@ -0,0 +1,143 @@
+/*
+ *
+ *    Copyright (c) 2020-2022 Project CHIP Authors
+ *
+ *    Licensed under the Apache License, Version 2.0 (the "License");
+ *    you may not use this file except in compliance with the License.
+ *    You may obtain a copy of the License at
+ *
+ *        http://www.apache.org/licenses/LICENSE-2.0
+ *
+ *    Unless required by applicable law or agreed to in writing, software
+ *    distributed under the License is distributed on an "AS IS" BASIS,
+ *    WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
+ *    See the License for the specific language governing permissions and
+ *    limitations under the License.
+ */
+
+/**
+ *    @file
+ *      This file implements a unit test suite for the Configuration Manager
+ *      code functionality.
+ *
+ */
+
+#include <inttypes.h>
+#include <stdarg.h>
+#include <stdio.h>
+#include <stdlib.h>
+#include <string.h>
+
+#include <lib/support/CHIPMem.h>
+#include <lib/support/CodeUtils.h>
+#include <lib/support/UnitTestRegistration.h>
+#include <nlunit-test.h>
+#include <platform/CHIPDeviceLayer.h>
+#include <platform/DeviceControlServer.h>
+
+using namespace chip;
+using namespace chip::Logging;
+using namespace chip::DeviceLayer;
+
+namespace {
+
+constexpr FabricIndex kTestAccessingFabricIndex1 = 1;
+constexpr FabricIndex kTestAccessingFabricIndex2 = 2;
+
+// =================================
+//      Unit tests
+// =================================
+
+static void TestPlatformMgr_Init(nlTestSuite * inSuite, void * inContext)
+{
+    CHIP_ERROR err = PlatformMgr().InitChipStack();
+    NL_TEST_ASSERT(inSuite, err == CHIP_NO_ERROR);
+}
+
+static void TestFailSafeContext_ArmFailSafe(nlTestSuite * inSuite, void * inContext)
+{
+    CHIP_ERROR err = CHIP_NO_ERROR;
+
+    FailSafeContext & failSafeContext = DeviceControlServer::DeviceControlSvr().GetFailSafeContext();
+
+    err = failSafeContext.ArmFailSafe(kTestAccessingFabricIndex1, System::Clock::Seconds16(1));
+    NL_TEST_ASSERT(inSuite, err == CHIP_NO_ERROR);
+    NL_TEST_ASSERT(inSuite, failSafeContext.IsFailSafeArmed() == true);
+    NL_TEST_ASSERT(inSuite, failSafeContext.GetFabricIndex() == kTestAccessingFabricIndex1);
+    NL_TEST_ASSERT(inSuite, failSafeContext.IsFailSafeArmed(kTestAccessingFabricIndex1) == true);
+    NL_TEST_ASSERT(inSuite, failSafeContext.IsFailSafeArmed(kTestAccessingFabricIndex2) == false);
+
+    err = failSafeContext.DisarmFailSafe();
+    NL_TEST_ASSERT(inSuite, err == CHIP_NO_ERROR);
+    NL_TEST_ASSERT(inSuite, failSafeContext.IsFailSafeArmed() == false);
+}
+
+static void TestFailSafeContext_NocCommandInvoked(nlTestSuite * inSuite, void * inContext)
+{
+    CHIP_ERROR err = CHIP_NO_ERROR;
+
+    FailSafeContext & failSafeContext = DeviceControlServer::DeviceControlSvr().GetFailSafeContext();
+
+    err = failSafeContext.ArmFailSafe(kTestAccessingFabricIndex1, System::Clock::Seconds16(1));
+    NL_TEST_ASSERT(inSuite, err == CHIP_NO_ERROR);
+    NL_TEST_ASSERT(inSuite, failSafeContext.GetFabricIndex() == kTestAccessingFabricIndex1);
+
+    failSafeContext.SetAddNocCommandInvoked(kTestAccessingFabricIndex2);
+    NL_TEST_ASSERT(inSuite, failSafeContext.NocCommandHasBeenInvoked() == true);
+    NL_TEST_ASSERT(inSuite, failSafeContext.AddNocCommandHasBeenInvoked() == true);
+    NL_TEST_ASSERT(inSuite, failSafeContext.GetFabricIndex() == kTestAccessingFabricIndex2);
+
+    failSafeContext.SetUpdateNocCommandInvoked(kTestAccessingFabricIndex1);
+    NL_TEST_ASSERT(inSuite, failSafeContext.NocCommandHasBeenInvoked() == true);
+    NL_TEST_ASSERT(inSuite, failSafeContext.UpdateNocCommandHasBeenInvoked() == true);
+    NL_TEST_ASSERT(inSuite, failSafeContext.GetFabricIndex() == kTestAccessingFabricIndex1);
+
+    err = failSafeContext.DisarmFailSafe();
+}
+
+/**
+ *   Test Suite. It lists all the test functions.
+ */
+static const nlTest sTests[] = {
+
+    NL_TEST_DEF("Test PlatformMgr::Init", TestPlatformMgr_Init),
+    NL_TEST_DEF("Test FailSafeContext::ArmFailSafe", TestFailSafeContext_ArmFailSafe),
+    NL_TEST_DEF("Test FailSafeContext::NocCommandInvoked", TestFailSafeContext_NocCommandInvoked), NL_TEST_SENTINEL()
+};
+
+/**
+ *  Set up the test suite.
+ */
+int TestFailSafeContext_Setup(void * inContext)
+{
+    CHIP_ERROR error = chip::Platform::MemoryInit();
+    if (error != CHIP_NO_ERROR)
+        return FAILURE;
+    return SUCCESS;
+}
+
+/**
+ *  Tear down the test suite.
+ */
+int TestFailSafeContext_Teardown(void * inContext)
+{
+    PlatformMgr().Shutdown();
+    chip::Platform::MemoryShutdown();
+    return SUCCESS;
+}
+
+} // namespace
+
+/**
+ *  Main
+ */
+int TestFailSafeContext()
+{
+    nlTestSuite theSuite = { "FailSafeContext tests", &sTests[0], TestFailSafeContext_Setup, TestFailSafeContext_Teardown };
+
+    // Run test suit againt one context.
+    nlTestRunner(&theSuite, nullptr);
+    return nlTestRunnerStats(&theSuite);
+}
+
+CHIP_REGISTER_TEST_SUITE(TestFailSafeContext)