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Use separate key instances for span/array/array+offset test classes (#34199)
Because the key object generation was done in the algorithm-specific base class,
the triplet of interface types was using the key instances in parallel.
By moving the static variable (and initialization thereof) to each of the derived
classes, the key objects are unique per class, which matches the test parallelism.
Making the classes be part of the same test collection would also solve this problem,
which would save on a few random keygens, but would likely overall take more
time due to the number of tests that would be moved to sequential execution.
Copy file name to clipboardExpand all lines: src/libraries/Common/tests/System/Security/Cryptography/AlgorithmImplementations/DSA/DSASignatureFormatTests.cs
Copy file name to clipboardExpand all lines: src/libraries/Common/tests/System/Security/Cryptography/AlgorithmImplementations/ECDsa/ECDsaSignatureFormatTests.cs
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