diff --git a/src/credentials/tests/CHIPCert_test_vectors.cpp b/src/credentials/tests/CHIPCert_test_vectors.cpp
index 9a21d934f52ec5..eb84e7d3dabb11 100644
--- a/src/credentials/tests/CHIPCert_test_vectors.cpp
+++ b/src/credentials/tests/CHIPCert_test_vectors.cpp
@@ -32,7 +32,7 @@ namespace chip {
 namespace TestCerts {
 
 // clang-format off
-extern const uint8_t gTestCerts[] = {
+extern const TestCert gTestCerts[] = {
     TestCert::kRoot01,
     TestCert::kRoot02,
     TestCert::kRoot03,
@@ -55,7 +55,7 @@ extern const uint8_t gTestCerts[] = {
 
 extern const size_t gNumTestCerts = ArraySize(gTestCerts);
 
-CHIP_ERROR GetTestCert(uint8_t certType, BitFlags<TestCertLoadFlags> certLoadFlags, ByteSpan & cert)
+CHIP_ERROR GetTestCert(TestCert certType, BitFlags<TestCertLoadFlags> certLoadFlags, ByteSpan & cert)
 {
     CHIP_ERROR err;
     bool derForm = certLoadFlags.Has(TestCertLoadFlags::kDERForm);
@@ -96,7 +96,7 @@ CHIP_ERROR GetTestCert(uint8_t certType, BitFlags<TestCertLoadFlags> certLoadFla
     return err;
 }
 
-const char * GetTestCertName(uint8_t certType)
+const char * GetTestCertName(TestCert certType)
 {
 #define NAME_CERT(NAME)                                                                                                            \
     do                                                                                                                             \
@@ -129,7 +129,7 @@ const char * GetTestCertName(uint8_t certType)
     return nullptr;
 }
 
-CHIP_ERROR GetTestCertPubkey(uint8_t certType, ByteSpan & pubkey)
+CHIP_ERROR GetTestCertPubkey(TestCert certType, ByteSpan & pubkey)
 {
     CHIP_ERROR err;
 
@@ -169,7 +169,7 @@ CHIP_ERROR GetTestCertPubkey(uint8_t certType, ByteSpan & pubkey)
     return err;
 }
 
-CHIP_ERROR GetTestCertSKID(uint8_t certType, ByteSpan & skid)
+CHIP_ERROR GetTestCertSKID(TestCert certType, ByteSpan & skid)
 {
     CHIP_ERROR err;
 
@@ -209,7 +209,7 @@ CHIP_ERROR GetTestCertSKID(uint8_t certType, ByteSpan & skid)
     return err;
 }
 
-CHIP_ERROR GetTestCertAKID(uint8_t certType, ByteSpan & akid)
+CHIP_ERROR GetTestCertAKID(TestCert certType, ByteSpan & akid)
 {
     CHIP_ERROR err;
 
@@ -249,7 +249,7 @@ CHIP_ERROR GetTestCertAKID(uint8_t certType, ByteSpan & akid)
     return err;
 }
 
-CHIP_ERROR LoadTestCert(ChipCertificateSet & certSet, uint8_t certType, BitFlags<TestCertLoadFlags> certLoadFlags,
+CHIP_ERROR LoadTestCert(ChipCertificateSet & certSet, TestCert certType, BitFlags<TestCertLoadFlags> certLoadFlags,
                         BitFlags<CertDecodeFlags> decodeFlags)
 {
     CHIP_ERROR err;
diff --git a/src/credentials/tests/CHIPCert_test_vectors.h b/src/credentials/tests/CHIPCert_test_vectors.h
index dc717f396eeccb..521426ee3e5084 100644
--- a/src/credentials/tests/CHIPCert_test_vectors.h
+++ b/src/credentials/tests/CHIPCert_test_vectors.h
@@ -68,15 +68,15 @@ enum class TestCertLoadFlags : uint8_t
     kSetAppDefinedCertType = 0x20,
 };
 
-extern CHIP_ERROR GetTestCert(uint8_t certType, BitFlags<TestCertLoadFlags> certLoadFlags, ByteSpan & cert);
-extern const char * GetTestCertName(uint8_t certType);
-extern CHIP_ERROR GetTestCertPubkey(uint8_t certType, ByteSpan & pubkey);
-extern CHIP_ERROR GetTestCertSKID(uint8_t certType, ByteSpan & skid);
-extern CHIP_ERROR GetTestCertAKID(uint8_t certType, ByteSpan & akid);
-extern CHIP_ERROR LoadTestCert(ChipCertificateSet & certSet, uint8_t certType, BitFlags<TestCertLoadFlags> certLoadFlags,
+extern CHIP_ERROR GetTestCert(TestCert certType, BitFlags<TestCertLoadFlags> certLoadFlags, ByteSpan & cert);
+extern const char * GetTestCertName(TestCert certType);
+extern CHIP_ERROR GetTestCertPubkey(TestCert certType, ByteSpan & pubkey);
+extern CHIP_ERROR GetTestCertSKID(TestCert certType, ByteSpan & skid);
+extern CHIP_ERROR GetTestCertAKID(TestCert certType, ByteSpan & akid);
+extern CHIP_ERROR LoadTestCert(ChipCertificateSet & certSet, TestCert certType, BitFlags<TestCertLoadFlags> certLoadFlags,
                                BitFlags<CertDecodeFlags> decodeFlags);
 
-extern const uint8_t gTestCerts[];
+extern const TestCert gTestCerts[];
 extern const size_t gNumTestCerts;
 
 // ------------------------------ DECLARATIONS ----------------------------------------
diff --git a/src/credentials/tests/TestChipCert.cpp b/src/credentials/tests/TestChipCert.cpp
index 4d81940f9b8549..1a8da833c06173 100644
--- a/src/credentials/tests/TestChipCert.cpp
+++ b/src/credentials/tests/TestChipCert.cpp
@@ -171,7 +171,7 @@ static void TestChipCert_ChipToX509(nlTestSuite * inSuite, void * inContext)
 
     for (size_t i = 0; i < gNumTestCerts; i++)
     {
-        uint8_t certType = gTestCerts[i];
+        TestCert certType = gTestCerts[i];
 
         err = GetTestCert(certType, sNullLoadFlag, inCert);
         NL_TEST_ASSERT(inSuite, err == CHIP_NO_ERROR);
@@ -267,7 +267,7 @@ static void TestChipCert_X509ToChip(nlTestSuite * inSuite, void * inContext)
 
     for (size_t i = 0; i < gNumTestCerts; i++)
     {
-        uint8_t certType = gTestCerts[i];
+        TestCert certType = gTestCerts[i];
 
         err = GetTestCert(certType, sDerFormFlag, inCert);
         NL_TEST_ASSERT(inSuite, err == CHIP_NO_ERROR);
@@ -368,7 +368,7 @@ static void TestChipCert_CertValidation(nlTestSuite * inSuite, void * inContext)
         int mExpectedTrustAnchorIndex;
         struct
         {
-            uint8_t Type;
+            TestCert Type;
             BitFlags<CertDecodeFlags> DecodeFlags;
             BitFlags<TestCertLoadFlags> LoadFlags;
         } InputCerts[kMaxCertsPerTestCase];
@@ -832,7 +832,7 @@ static void TestChipCert_ValidateChipRCAC(nlTestSuite * inSuite, void * inContex
 {
     struct RCACTestCase
     {
-        uint8_t Cert;
+        TestCert Cert;
         CHIP_ERROR mExpectedResult;
     };
 
@@ -1191,7 +1191,7 @@ static void TestChipCert_CertType(nlTestSuite * inSuite, void * inContext)
 
     struct TestCase
     {
-        uint8_t Cert;
+        TestCert Cert;
         CertType ExpectedCertType;
     };
 
@@ -1237,7 +1237,7 @@ static void TestChipCert_CertId(nlTestSuite * inSuite, void * inContext)
 
     struct TestCase
     {
-        uint8_t Cert;
+        TestCert Cert;
         uint64_t ExpectedCertId;
     };
 
@@ -1728,8 +1728,8 @@ static void TestChipCert_ExtractNodeIdFabricId(nlTestSuite * inSuite, void * inC
 {
     struct TestCase
     {
-        uint8_t Cert;
-        uint8_t ICACert;
+        TestCert Cert;
+        TestCert ICACert;
         uint64_t ExpectedNodeId;
         uint64_t ExpectedFabricId;
     };
@@ -1844,8 +1844,8 @@ static void TestChipCert_ExtractOperationalDiscoveryId(nlTestSuite * inSuite, vo
 {
     struct TestCase
     {
-        uint8_t Noc;
-        uint8_t Rcac;
+        TestCert Noc;
+        TestCert Rcac;
         uint64_t ExpectedNodeId;
         uint64_t ExpectedFabricId;
         uint64_t ExpectedCompressedFabricId;
@@ -1900,7 +1900,7 @@ static void TestChipCert_ExtractAndValidateCATsFromOpCert(nlTestSuite * inSuite,
 {
     struct TestCase
     {
-        uint8_t Cert;
+        TestCert Cert;
         CATValues ExpectedCATs;
     };
 
@@ -1986,7 +1986,7 @@ static void TestChipCert_ExtractSubjectDNFromChipCert(nlTestSuite * inSuite, voi
 {
     struct TestCase
     {
-        uint8_t Cert;
+        TestCert Cert;
         ChipDN ExpectedSubjectDN;
     };
 
@@ -2058,7 +2058,7 @@ static void TestChipCert_ExtractPublicKeyAndSKID(nlTestSuite * inSuite, void * i
 {
     struct TestCase
     {
-        uint8_t Cert;
+        TestCert Cert;
         ByteSpan ExpectedPublicKey;
         ByteSpan ExpectedSKID;
     };
diff --git a/src/crypto/tests/CHIPCryptoPALTest.cpp b/src/crypto/tests/CHIPCryptoPALTest.cpp
index 14e5ec9c052ead..39d9998fa95b80 100644
--- a/src/crypto/tests/CHIPCryptoPALTest.cpp
+++ b/src/crypto/tests/CHIPCryptoPALTest.cpp
@@ -2005,7 +2005,7 @@ static void TestPubkey_x509Extraction(nlTestSuite * inSuite, void * inContext)
 
     for (size_t i = 0; i < gNumTestCerts; i++)
     {
-        uint8_t certType = TestCerts::gTestCerts[i];
+        TestCert certType = TestCerts::gTestCerts[i];
 
         err = GetTestCert(certType, TestCertLoadFlags::kDERForm, cert);
         NL_TEST_ASSERT(inSuite, err == CHIP_NO_ERROR);
@@ -2193,7 +2193,7 @@ static void TestSKID_x509Extraction(nlTestSuite * inSuite, void * inContext)
 
     for (size_t i = 0; i < gNumTestCerts; i++)
     {
-        uint8_t certType = gTestCerts[i];
+        TestCert certType = gTestCerts[i];
 
         err = GetTestCert(certType, TestCertLoadFlags::kDERForm, cert);
         NL_TEST_ASSERT(inSuite, err == CHIP_NO_ERROR);
@@ -2220,7 +2220,7 @@ static void TestAKID_x509Extraction(nlTestSuite * inSuite, void * inContext)
 
     for (size_t i = 0; i < gNumTestCerts; i++)
     {
-        uint8_t certType = gTestCerts[i];
+        TestCert certType = gTestCerts[i];
 
         err = GetTestCert(certType, TestCertLoadFlags::kDERForm, cert);
         NL_TEST_ASSERT(inSuite, err == CHIP_NO_ERROR);
@@ -2360,7 +2360,7 @@ static void TestSerialNumber_x509Extraction(nlTestSuite * inSuite, void * inCont
 
     struct SerialNumberTestCase
     {
-        uint8_t Cert;
+        TestCert Cert;
         ByteSpan mExpectedResult;
     };
 
@@ -2401,7 +2401,7 @@ static void TestSubject_x509Extraction(nlTestSuite * inSuite, void * inContext)
 
     struct TestCase
     {
-        uint8_t Cert;
+        TestCert Cert;
         ChipDN mExpectedDN;
     };
 
@@ -2475,7 +2475,7 @@ static void TestIssuer_x509Extraction(nlTestSuite * inSuite, void * inContext)
 
     struct TestCase
     {
-        uint8_t Cert;
+        TestCert Cert;
         ChipDN mExpectedDN;
     };