https://www.youtube.com/watch?v=GI3N3HVN3xc
3 files CIF file - reference model XRD file - collected in very slow scan rate IRF file - (optional)
Rietveld, H.M. (1969), A profile refinement method for nuclear and magnetic structures. J. Appl. Cryst., 2: 65-71. https://doi.org/10.1107/S0021889869006558
FullProf : Rietveld, Profile Matching & Integrated Intensities Refinement of X-ray and/or Neutron Data (powder and/or single-crystal)[ link ]
Flores-Cano, D. A., Chino-Quispe, A. R., Rueda Vellasmin, R., Ocampo-Anticona, J. A., González, J. C., & Ramos-Guivar, J. A. (2021). Fifty years of Rietveld refinement: Methodology and guidelines in superconductors and functional magnetic nanoadsorbents. Revista De Investigación De Física, 24(3), 39–48. https://doi.org/10.15381/rif.v24i3.21028
Vitalij K. Pecharsky , Peter Y. Zavalij. Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition - Textbook (c) 2009 [ link ]
Rietveld Refinement for Macromolecular Powder Diffraction Maria Spiliopoulou, Dimitris-Panagiotis Triandafillidis, Alexandros Valmas, Christos Kosinas, Andrew N. Fitch, Robert B. Von Dreele, and Irene Margiolaki Crystal Growth & Design 2020 20 (12), 8101-8123 DOI: 10.1021/acs.cgd.0c00939
The Rietveld Refinement Method: Half of a Century Anniversary Tomče Runčevski and Craig M. Brown Crystal Growth & Design 2021 21 (9), 4821-4822 DOI: 10.1021/acs.cgd.1c00854
Diffraction Line Profiles in the Rietveld Method Paolo Scardi Crystal Growth & Design 2020 20 (10), 6903-6916 DOI: 10.1021/acs.cgd.0c00956