Simple thickness determination of thin films from XRR (X-ray reflectometry) data from Fourier transforms.
The code has very few dependencies. Simply run:
pip install -r requirements.txtThis should work in most python environments without issues.
See run_analysis.py for an example. Data parsers for Bruker .brml-files and Bruker .xy-files are included along with some example measurements. The only additional requirement is a crystallographic information file (.cif) of the thin film material.
All the people putting their code and knowledge out there to the community are very much appreciated:
- The brml-parser is a slight modification of the parser from PyXRD, distributed under a FreeBSD-license.
- The FFT implementation is based on: https://opara.zih.tu-dresden.de/xmlui/handle/123456789/1804 as described in the paper: Fast Fourier transform and multi-Gaussian fitting of XRR data to determine the thickness of ALD grown thin films within the initial growth regime.
- The code uses the Dans_diffraction package, which is very useful for fundamental crystallography and diffraction problems.